3 results
F23 A Novel TXRF Instrumentation for Contamination Control on 300 mm Silicon Wafers Employing Synchrotron Radiation
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- Journal:
- Powder Diffraction / Volume 18 / Issue 2 / June 2003
- Published online by Cambridge University Press:
- 20 May 2016, p. 177
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F15 Arrays of large-area silicon drift detectors for advanced analytical techniques
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- Journal:
- Powder Diffraction / Volume 21 / Issue 2 / June 2006
- Published online by Cambridge University Press:
- 20 May 2016, p. 182
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F-15 Novel Silicon Drift Detectors with Enhanced Reliability for Increasing Requirements of Analytical Applications
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- Journal:
- Powder Diffraction / Volume 22 / Issue 2 / June 2007
- Published online by Cambridge University Press:
- 20 May 2016, p. 178
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